TY  - GEN
AU  - Alexe, M.
AU  - Gruverman
TI  - Nanoscale characterisation of ferroelectric materials: scanning probe microscopy approach / 
T2  - Nanoscience and technology
SN  - 9783540206620 (hbk. ): 
U1  - 538 23
PY  - 2004///
CY  - Berlin: 
PB  - Springer- Verlag, 
KW  - Nanostructured materials
KW  - Nanotechnology
KW  - Physics
N1  - Includes bibliography and index
N2  - This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior
ER  -