TY  - GEN
AU  - Ichimiya, Ayahiko 
AU  - Cohen, Philip I.
TI  - Reflection high energy electron diffraction/ 
SN  - 9780521184021 (pbk. ): 
U1  - 530.4275 23rd
PY  - 2004///
CY  - Cambridge: 
PB  - Cambridge University Press, 
KW  - Reflection high energy electron diffraction
KW  - Thin films
KW  - Surfaces
KW  - Analysis
KW  - Physics
N1  - Includes bibliography and index
N2  - "Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts.
ER  -