TY  - GEN
AU  - Goldstein, J., Newbury, D.E., Joy, D.C., Lyman
AU  - Newbury, Dale E.
AU  - Michael, Joseph R.
AU  - Richie, Nicholas W. M.
AU  - Scott, John Henry J.
AU  - Joy, David C.
TI  - Scanning electron microscopy and X-Ray microanalysis
SN  - 9781493966745
U1  - 502.825 23rd
PY  - 2018///
CY  - New York
PB  - Springer
KW  - Scanning electron microscopy.
KW  - Microscopy
KW  - X-ray microanalysis
KW  - Electron
N1  - Includes bibliographic references and index
N2  - A hefty text, substantially revised (first edition, 1981), introduces the topic, with an emphasis on practical aspects of the techniques described. Basic material is highlighted to aid newcomers. A new chapter covers quantitative X-ray microanalysis of bulk samples. Annotation copyright Book News, Inc. Portland
ER  -