TY  - GEN
AU  - Goodhew, Peter J. 
AU  - Humphreys, John
AU  - Beanland, Richard
TI  - Electron microscopy and analysis
SN  - 9780748409686 (pbk.)
U1  - 502.825 23rd
PY  - 2001///
CY  - London
PB  - Taylor & Francis Group
KW  - Electron microscopy.
KW  - Electron diffraction
KW  - General Science
N1  - Includes bibliographical references and index
N2  - Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context
ER  -