Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy/ [edited by] Sergei V. Kalinin [and] Alexei Gruverman

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Publication details: New York: Springer- Verlag, c2010Description: xviii, 555 p. : ill. (chiefly col. ); 24 cmISBN:

9781441965677 (hbk. : alk. paper):

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DDC classification:

23 502.82 KAL/S

Summary: Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Reference Book	Transit Campus Physics	502.82 KAL (Browse shelf(Opens below))	Available		003317

Includes bibliographical reference and index.

Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.

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