000			01265 a2200265 4500
999			_c1043 _d1043
003			OSt
005			20240612020503.0
008			190822b xxu||||| |||| 00| 0 eng d
020			_a9783540206620 (hbk. ): _cEURO 169.99
040			_cIISER- BPR _dIISER- BPR
082			_223 _a538 _bALE/N
222			_aPHYSICS
245	1		_aNanoscale characterisation of ferroelectric materials: scanning probe microscopy approach / _cedited by M. Alexe [and] A. Gruverman
260			_aBerlin: _bSpringer- Verlag, _cc2004
300			_aix, 282 p. : _bill. (some col); _c24 cm.
490			_aNanoscience and technology
504			_aIncludes bibliography and index.
520			_aThis book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior.
650			_aNanostructured materials.
650			_aNanotechnology.
650			_aPhysics
700			_4editor _aAlexe, M.
700			_4editor _aGruverman
942			_2ddc _cBK _02