000			a
999			_c1205 _d1205
003			OSt
005			20200214170724.0
008			200214b xxu||||| |||| 00| 0 eng d
020			_a9780521184021 (pbk. ): _cUKP 49.99
040			_cIISER- BPR _dIISER- BPR
082			_223rd _a530.4275 _bICH/R
100			_aIchimiya, Ayahiko
222			_aPHYSICS
245			_aReflection high energy electron diffraction/ _c[by] Ayahiko Ichimiya and Philip I. Cohen
260			_aCambridge: _bCambridge University Press, _cc2004
300			_axi, 353 p. : _bill.; _c25 cm.
504			_aIncludes bibliography and index.
520			_a"Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts.
650			_aReflection high energy electron diffraction.
650			_aThin films _vSurfaces _xAnalysis.
650			_aPhysics
700			_aCohen, Philip I.
942			_2ddc _cBK