000			a
999			_c1292 _d1292
003			OSt
005			20210709123046.0
008			210709b xxu||||| |||| 00| 0 eng d
020			_a9781493966745
040			_bENG _cIISER-BPR _dIISER-BPR
082			_223rd _a502.825 _bGOL/S
100			_aGoldstein, J., Newbury, D.E., Joy, D.C., Lyman
222			_aPHYSICS
245			_aScanning electron microscopy and X-Ray microanalysis / _c[by] Joseph I. Goldstein [et. al.]
250			_a4th ed.
260			_aNew York: _bSpringer, _cc2018
300			_axxii, 579 p. : _bill. ; _c29 cm.
504			_aIncludes bibliographic references and index.
520			_aA hefty text, substantially revised (first edition, 1981), introduces the topic, with an emphasis on practical aspects of the techniques described. Basic material is highlighted to aid newcomers. A new chapter covers quantitative X-ray microanalysis of bulk samples. Annotation copyright Book News, Inc. Portland.
650			_aScanning electron microscopy.
650			_aMicroscopy.
650			_aX-ray microanalysis.
650			_aElectron.
700			_aNewbury, Dale E.
700			_aMichael, Joseph R.
700			_aRichie, Nicholas W. M.
700			_aScott, John Henry J.
700			_aJoy, David C.
942			_2ddc _cBK