| 000 | a | ||
|---|---|---|---|
| 999 |
_c1293 _d1293 |
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| 003 | OSt | ||
| 005 | 20210323104638.0 | ||
| 008 | 210323b xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9780748409686 (pbk.) | ||
| 040 |
_cIISER-BPR _dIISER-BPR |
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| 082 |
_223rd _a502.825 _bGOO/E |
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| 100 | _aGoodhew, Peter J. | ||
| 222 | _aPHYSICS | ||
| 245 |
_aElectron microscopy and analysis / _cPeter J. Goodhew |
||
| 250 | _a3rd ed. | ||
| 260 |
_aLondon: _bTaylor & Francis Group, _c©2001 |
||
| 300 |
_ax, 251 pages: _billustrations ; _c24 cm. |
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| 504 | _aIncludes bibliographical references and index. | ||
| 520 | _aElectron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. | ||
| 650 | _aElectron microscopy. | ||
| 650 | _aElectron diffraction. | ||
| 650 | _aGeneral Science. | ||
| 700 | _aHumphreys, John | ||
| 700 | _aBeanland, Richard | ||
| 942 |
_2ddc _cBK |
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