000			01122cam a22002775i 4500
999			_c923 _d923
001			19082511
003			OSt
005			20190326155941.0
008			160505s2016 nyu 000 0 eng
020			_a9783319398761 (alk. paper: hbk. ): _cEURO 39.99
040			_aDLC _beng _cIISER- BPR _erda _dIISER- BPR
041			_aENG
042			_apcc
082			_223rd _a502.825 _bEGE/P
100			_aEgerton, R. F.
222			_aPHYSICS
245	0	0	_aPhysical principles of electron microscopy: an introduction to TEM, SEM, and AEM/ _c[by] R. F. Egerton
250			_a2nd ed.
260			_aSwitzerland: _bSpringer, _cc2016
300			_axi, 196 p. : _bill. ; _c24 cm.
500			_aIncludes bibliographical references and Index.
520			_aThis book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
650			_aMicroscopy
650			_aElectron microscopy
650			_aPhysics
906			_a0 _bibc _corignew _d2 _eepcn _f20 _gy-gencatlg
942			_2ddc _cBK