Normal view MARC view ISBD view

Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale: 2 vol. set

Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale: 2 vol. set [edited by] Sergei Kalinin [and] Alexei Gruverman - New York: Springer- Verlag, c2007 - V. 1 (xx, 558, [7] p.) : V. 2 (xx, 980 .p): chiefly col. ill.; 24 cm.

Includes bibliographical references and index.

ISBN: 9780387286679 (hbk.: alk. paper): EURO 349.95

Subjects--Topical Terms:
Scanning probe microscopy.
Nanoelectronics.
Physics

Dewey Class. No.: 502.82 / KAL/S

Place hold
Print
Add to your cart (remove)
Send to device
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)