Scanning electron microscopy and X-Ray microanalysis /
Goldstein, J., Newbury, D.E., Joy, D.C., Lyman
Scanning electron microscopy and X-Ray microanalysis / [by] Joseph I. Goldstein [et. al.] - 4th ed. - New York: Springer, c2018 - xxii, 579 p. : ill. ; 29 cm.
Includes bibliographic references and index.
A hefty text, substantially revised (first edition, 1981), introduces the topic, with an emphasis on practical aspects of the techniques described. Basic material is highlighted to aid newcomers. A new chapter covers quantitative X-ray microanalysis of bulk samples. Annotation copyright Book News, Inc. Portland.
9781493966745 = PHYSICS
Scanning electron microscopy.
Microscopy.
X-ray microanalysis.
Electron.
502.825 / GOL/S
Scanning electron microscopy and X-Ray microanalysis / [by] Joseph I. Goldstein [et. al.] - 4th ed. - New York: Springer, c2018 - xxii, 579 p. : ill. ; 29 cm.
Includes bibliographic references and index.
A hefty text, substantially revised (first edition, 1981), introduces the topic, with an emphasis on practical aspects of the techniques described. Basic material is highlighted to aid newcomers. A new chapter covers quantitative X-ray microanalysis of bulk samples. Annotation copyright Book News, Inc. Portland.
9781493966745 = PHYSICS
Scanning electron microscopy.
Microscopy.
X-ray microanalysis.
Electron.
502.825 / GOL/S