Electron microscopy and analysis / Peter J. Goodhew
Publication details: London: Taylor & Francis Group, ©2001Edition: 3rd edDescription: x, 251 pages: illustrations ; 24 cmISBN:- 9780748409686 (pbk.)
- 23rd 502.825 GOO/E
Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Books | Vigyanpuri Campus Physics | 502.825 GOO (Browse shelf(Opens below)) | Available | 004267 | |
Books | Vigyanpuri Campus Physics | 502.825 GOO (Browse shelf(Opens below)) | Available | 004268 |
Browsing Vigyanpuri Campus shelves, Shelving location: Physics Close shelf browser (Hides shelf browser)
Includes bibliographical references and index.
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context.
There are no comments on this title.