Nanoscale characterisation of ferroelectric materials: scanning probe microscopy approach /
Nanoscale characterisation of ferroelectric materials: scanning probe microscopy approach /
edited by M. Alexe [and] A. Gruverman
- Berlin: Springer- Verlag, c2004
- ix, 282 p. : ill. (some col); 24 cm.
- Nanoscience and technology .
Includes bibliography and index.
This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior.
9783540206620 (hbk. ): EURO 169.99 = PHYSICS
Nanostructured materials.
Nanotechnology.
Physics
538 / ALE/N
Includes bibliography and index.
This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior.
9783540206620 (hbk. ): EURO 169.99 = PHYSICS
Nanostructured materials.
Nanotechnology.
Physics
538 / ALE/N