Nanoscale characterisation of ferroelectric materials: scanning probe microscopy approach / edited by M. Alexe [and] A. Gruverman

Contributor(s):

Series: Nanoscience and technologyPublication details: Berlin: Springer- Verlag, c2004Description: ix, 282 p. : ill. (some col); 24 cmISBN:

9783540206620 (hbk. ):

Subject(s):

DDC classification:

23 538 ALE/N

Summary: This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior.

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Reference Book	Transit Campus Physics	538 ALE/N (Browse shelf(Opens below))	Available		003420

Includes bibliography and index.

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior.

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