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Reflection high energy electron diffraction/

Ichimiya, Ayahiko

Reflection high energy electron diffraction/ [by] Ayahiko Ichimiya and Philip I. Cohen - Cambridge: Cambridge University Press, c2004 - xi, 353 p. : ill.; 25 cm.

Includes bibliography and index.

"Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts.

9780521184021 (pbk. ): UKP 49.99 = PHYSICS


Reflection high energy electron diffraction.
Thin films--Analysis.--Surfaces
Physics

530.4275 / ICH/R