Reflection high energy electron diffraction/ (Record no. 1205)
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| 000 -LEADER | |
|---|---|
| fixed length control field | a |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20200214170724.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 200214b xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780521184021 (pbk. ): |
| Terms of availability | UKP 49.99 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | IISER- BPR |
| Modifying agency | IISER- BPR |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Edition number | 23rd |
| Classification number | 530.4275 |
| Item number | ICH/R |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Ichimiya, Ayahiko |
| 222 ## - KEY TITLE | |
| Key title | PHYSICS |
| 245 ## - TITLE STATEMENT | |
| Title | Reflection high energy electron diffraction/ |
| Statement of responsibility, etc | [by] Ayahiko Ichimiya and Philip I. Cohen |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc | Cambridge: |
| Name of publisher, distributor, etc | Cambridge University Press, |
| Date of publication, distribution, etc | c2004 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xi, 353 p. : |
| Other physical details | ill.; |
| Dimensions | 25 cm. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc | Includes bibliography and index. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | "Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Reflection high energy electron diffraction. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Thin films |
| Form subdivision | Surfaces |
| General subdivision | Analysis. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Physics |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Cohen, Philip I. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Dewey Decimal Classification |
| Koha item type | Books |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Source of acquisition | Cost, normal purchase price | Total Checkouts | Full call number | Barcode | Date last seen | Cost, replacement price | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Dewey Decimal Classification | Vigyanpuri Campus | Vigyanpuri Campus | Chemistry | 14/02/2020 | 29 | 3023.00 | 530.4275 ICH/R | 003929 | 14/02/2020 | 9492.00 | 14/02/2020 | Reference Book |