Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM/
Egerton, R. F.
Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM/ [by] R. F. Egerton - 2nd ed. - Switzerland: Springer, c2016 - xi, 196 p. : ill. ; 24 cm.
Includes bibliographical references and Index.
This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
9783319398761 (alk. paper: hbk. ): EURO 39.99 = PHYSICS
Microscopy
Electron microscopy
Physics
502.825 / EGE/P
Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM/ [by] R. F. Egerton - 2nd ed. - Switzerland: Springer, c2016 - xi, 196 p. : ill. ; 24 cm.
Includes bibliographical references and Index.
This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
9783319398761 (alk. paper: hbk. ): EURO 39.99 = PHYSICS
Microscopy
Electron microscopy
Physics
502.825 / EGE/P