000 -LEADER | |
---|---|
fixed length control field | 01122cam a22002775i 4500 |
001 - CONTROL NUMBER | |
control field | 19082511 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | OSt |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20190326155941.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 160505s2016 nyu 000 0 eng |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9783319398761 (alk. paper: hbk. ): |
Terms of availability | EURO 39.99 |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | DLC |
Language of cataloging | eng |
Transcribing agency | IISER- BPR |
Description conventions | rda |
Modifying agency | IISER- BPR |
041 ## - LANGUAGE CODE | |
Language code of text/sound track or separate title | ENG |
042 ## - AUTHENTICATION CODE | |
Authentication code | pcc |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Edition number | 23rd |
Classification number | 502.825 |
Item number | EGE/P |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Egerton, R. F. |
222 ## - KEY TITLE | |
Key title | PHYSICS |
245 00 - TITLE STATEMENT | |
Title | Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM/ |
Statement of responsibility, etc | [by] R. F. Egerton |
250 ## - EDITION STATEMENT | |
Edition statement | 2nd ed. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Place of publication, distribution, etc | Switzerland: |
Name of publisher, distributor, etc | Springer, |
Date of publication, distribution, etc | c2016 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | xi, 196 p. : |
Other physical details | ill. ; |
Dimensions | 24 cm. |
500 ## - GENERAL NOTE | |
General note | Includes bibliographical references and Index. |
520 ## - SUMMARY, ETC. | |
Summary, etc | This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Microscopy |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Electron microscopy |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Physics |
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
a | 0 |
b | ibc |
c | orignew |
d | 2 |
e | epcn |
f | 20 |
g | y-gencatlg |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Source of classification or shelving scheme | Dewey Decimal Classification |
Koha item type | Books |
Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Source of acquisition | Cost, normal purchase price | Full call number | Barcode | Date last seen | Cost, replacement price | Price effective from | Koha item type | Total Checkouts | Date checked out |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Dewey Decimal Classification | Transit Campus | Transit Campus | Physics | 21/03/2019 | 28 | 2063.00 | 502.825 EGE | 003231 | 21/03/2019 | 3174.40 | 21/03/2019 | Reference Book | ||||||
Dewey Decimal Classification | Vigyanpuri Campus | Vigyanpuri Campus | Physics | 21/03/2019 | 28 | 2063.00 | 502.825 EGE | 003232 | 01/02/2021 | 3174.40 | 21/03/2019 | Books | 1 | 12/01/2021 |