Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale: 2 vol. set [edited by] Sergei Kalinin [and] Alexei Gruverman

Contributor(s):

Language: ENG Publication details: New York: Springer- Verlag, c2007Description: V. 1 (xx, 558, [7] p.) : V. 2 (xx, 980 .p): chiefly col. ill.; 24 cmISBN:

9780387286679 (hbk.: alk. paper):

Subject(s):

DDC classification:

23 502.82 KAL/S

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Reference Book	Transit Campus Physics	502.82 KAL (Browse shelf(Opens below))	Available		003319
Books	Vigyanpuri Campus Physics	502.82 KAL (Browse shelf(Opens below))	Available		003318

Browsing Vigyanpuri Campus shelves, Shelving location: Physics Close shelf browser (Hides shelf browser)

								Next
	004.1 SAG Fundamentals of quantum information	005.133 LUT Learning Python /	333.95 ROS Win-win ecology: how the earth's species can survive in the midst of human enterprise/	502.82 KAL Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale: 2 vol. set	502.825 EGE Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM/	502.825 GOO Electron microscopy and analysis /	502.825 GOO Electron microscopy and analysis /	Next

Includes bibliographical references and index.

There are no comments on this title.

to post a comment.