Scanning electron microscopy and X-Ray microanalysis / [by] Joseph I. Goldstein [et. al.]

By:

Goldstein, J., Newbury, D.E., Joy, D.C., Lyman

Contributor(s):

Publication details: New York: Springer, c2018Edition: 4th edDescription: xxii, 579 p. : ill. ; 29 cmISBN:

9781493966745

Subject(s):

DDC classification:

23rd 502.825 GOL/S

Summary: A hefty text, substantially revised (first edition, 1981), introduces the topic, with an emphasis on practical aspects of the techniques described. Basic material is highlighted to aid newcomers. A new chapter covers quantitative X-ray microanalysis of bulk samples. Annotation copyright Book News, Inc. Portland.

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	Transit Campus Mathematics	502.825 GOL (Browse shelf(Opens below))	Available		004317

Browsing Transit Campus shelves, Shelving location: Mathematics Close shelf browser (Hides shelf browser)

Previous					No cover image available			Next
Previous	004.092 PAU/L Last lecture /	005.72 HUF Fundamentals of error correcting codes/	006.3843 HAY Quantum information theory: mathematical foundation/	502.825 GOL Scanning electron microscopy and X-Ray microanalysis /	509.54 INS Indian Science: Transforming India	510 CON Functions of one complex variables I/	510 CON For all practical purposes: introduction to contemporary mathematics/	Next

Includes bibliographic references and index.

A hefty text, substantially revised (first edition, 1981), introduces the topic, with an emphasis on practical aspects of the techniques described. Basic material is highlighted to aid newcomers. A new chapter covers quantitative X-ray microanalysis of bulk samples. Annotation copyright Book News, Inc. Portland.

There are no comments on this title.

to post a comment.