Normal view MARC view ISBD view

EXAFS : basic principles and data analysis /

Teo, Boon K.

EXAFS : basic principles and data analysis / by Boon K. Teo. - Berlin : Springer-Verlag, c1986. - xviii, 349 p. : ill. 17 tables, 88 fig. ; 25 cm. - Inorganic chemistry concepts ; v. 9 .

Includes bibliographical references and index.

ISBN: 9783642500336 (pbk.): EURO 79.95 = Physics-textbook

LCCN: 86001811

Subjects--Topical Terms:
Extended X-ray absorption fine structure.
Physics

LC Class. No.: QC482.S6 / T45 1986

Dewey Class. No.: 539.7222 / TEO/E

Place hold
Print
Add to your cart (remove)
Send to device
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)