Nanoscale characterisation of ferroelectric materials: scanning probe microscopy approach / edited by M. Alexe [and] A. Gruverman

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Series: Nanoscience and technologyPublication details: Berlin: Springer- Verlag, c2004Description: ix, 282 p. : ill. (some col); 24 cmISBN:

9783540206620 (hbk. ):

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DDC classification:

23 538 ALE/N

Summary: This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior.

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Item type	Current library	Call number	Status	Date due	Barcode
Reference Book	Transit Campus Physics	538 ALE/N (Browse shelf(Opens below))	Available		003420

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Previous	537.623 TIN/I Introduction to superconductivity/	537.626 GEN/S Superconductivity of metals and alloys/	537.6262 GAP/O Optical properties of semiconductor nanocrystals /	538 ALE/N Nanoscale characterisation of ferroelectric materials: scanning probe microscopy approach /	538 NOL/Q Quantum Theory of Magnetism/	538 TAG/D Domains in ferroic crystals and thin films/	538 TSY/H Handbook of spin transport and magnetism/	Next

Includes bibliography and index.

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior.

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