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Reflection high energy electron diffraction/ [by] Ayahiko Ichimiya and Philip I. Cohen

By: Contributor(s): Publication details: Cambridge: Cambridge University Press, c2004Description: xi, 353 p. : ill.; 25 cmISBN:
  • 9780521184021 (pbk. ):
Subject(s): DDC classification:
  • 23rd 530.4275 ICH/R
Summary: "Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts.
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Includes bibliography and index.

"Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts.

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