Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM/ [by] R. F. Egerton
Material type: TextLanguage: ENG Publication details: Switzerland: Springer, c2016Edition: 2nd edDescription: xi, 196 p. : ill. ; 24 cmISBN:- 9783319398761 (alk. paper: hbk. ):
- 23rd 502.825 EGE/P
Item type | Current library | Call number | Status | Date due | Barcode |
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Reference Book | Transit Campus Physics | 502.825 EGE (Browse shelf(Opens below)) | Available | 003231 | |
Books | Vigyanpuri Campus Physics | 502.825 EGE (Browse shelf(Opens below)) | Available | 003232 |
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Includes bibliographical references and Index.
This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
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