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Scanning electron microscopy and X-Ray microanalysis / [by] Joseph I. Goldstein [et. al.] by
- Goldstein, J., Newbury, D.E., Joy, D.C., Lyman
- Newbury, Dale E
- Michael, Joseph R
- Richie, Nicholas W. M
- Scott, John Henry J
- Joy, David C
Edition: 4th ed.
Publication details: New York: Springer, c2018
Availability: Items available for loan: Vigyanpuri Campus (1)Call number: 502.825 GOL.
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