Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM/ [by] R. F. Egerton

By:

Egerton, R. F

Material type: Text

TextLanguage: ENG Publication details: Switzerland: Springer, c2016Edition: 2nd edDescription: xi, 196 p. : ill. ; 24 cmISBN:

9783319398761 (alk. paper: hbk. ):

Subject(s):

DDC classification:

23rd 502.825 EGE/P

Summary: This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

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Holdings
Item type	Current library	Call number	Status	Barcode
Reference Book	Vigyanpuri Campus Physics	502.825 EGE (Browse shelf(Opens below))	Available	003231
Books	Vigyanpuri Campus Physics	502.825 EGE (Browse shelf(Opens below))	Available	003232

Includes bibliographical references and Index.

This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

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